Koehler K47920 (EDX3000) EDXRF Elemental Analyzer

Condition: New Brand new item from stock or on order from manufacturer
1 YEAR MANUFACTURER'S WARRANTY
Stock #:
N1379
Status:
Available In Stock (request a quote)
Dimensions (approx.):
23.6"W x 23.6"D x 15.7"H (outside)
Electrical:
100-240 Volts, 50/60 Hz,
Product Description For the determination of total sulfur in petroleum and petroleum products that are single-phase. These materials can include diesel fuel, jet fuel, kerosene, other distillate oil, naphtha, residual oil, lubricating base oil,
hydraulic oil, crude oil, unleaded gasoline, gasohol, and similar petroleum products.

Also, for the determination of the total lead content of a gasoline.

The EDX3000 Elemental Analyzer (K47920 EDXRF) can analyze a large array of elements from 11Na to 92U in solids, liquids, alloys, powders and thin films. The Advanced model delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types. The Silicon Drift Detector provides superior data quality and the multiple automated tube filters enhance sensitivity. Also, polarized excitation is used for lower detection limits.

Includes:
- 50 kV 50W X-ray Tube
- Four (4) Secondary Targets
- High Performance SDD Detector
- Software Fundamental Parameters which includes Profile Fitting, Bulk & Thin Film Models, and Scattering FP. Templates included are: Powders & Pellets, Fusion Bead, Polymer, Multi-Layer Thin Films, Water, Oil, & Liquids
- Helium Purge including 3m of 6 x 4mm tubing
- 15-Position Sample Tray (32mm)
- Computer, LCD Monitor, and Color Deskjet Printer
- Starter Kit (100 cups, 1 Roll Prolene Film, 5 Rolls Printer Paper, 2 Aperture O-Rings
- Helium Regulator, 2-stage, NPT Connections
- Training and Installation on-site (up to 8 hrs)

Software Features
- Menu Based Software for control of spectrometer functions and data analysis
- Application templates
- Simple Flow Bar Wizard to create new methods
- Profile Fitting Software for qualitative and quantitative analysis
- Matching library for augmentation of Fundamental Parameters
- Automatic spectral overlap deconvolution
- Empirical Calibration with overlap and matrix compensation

SPECIFICATIONS:
Conforms to the specifications of: ASTM D4294, D5059, D7220, ISO 20847, ISO 8754, IP 496, IP 336, JIS K 2541-1
Excitation:
50 kV X-Ray Tube with Pd Anode
50W Maximum Power
4 Standard Polarization and Secondary Targets depending on application,
for optimum excitation
Optional Fifth Target for Optimal Excitation of Na and Mg
Detection:
High Performance Silicon Drift Semiconductor Detector
Peltier Electronic Cooling
Optimum Balance of spectral resolution and high count rate
Detection Limits (LLD):
Sulfur: 0.54 ppm
Chlorine: 0.3 ppm
Lead: 0.0002 g/L
Nickel and Vanadium: 1 ppm
Iron: 2 pp,
Sample Chamber:
Large 38cm dia. X 10cm deep sample chamber for bulk samples
15-Position Automatic Sample Changer (32mm Sample Cups)
Analysis in Air, Helium Purge, or Vacuum Available
User Interface (Computer):
External PC Computer System including:
Microsoft Windows Vista Operating System
Keyboard and Mouse, Monitor
Printer
Environmental Conditions:
Ambient Temperatures 18 - 28°C (65 - 82°F)
Relative Humidity < 75%
Vibration undetectable by human
Free from corrosive gas, dust, and particles

Accessories:
K47990-1 10-Position Sample Tray (35 - 40 mm)
K47990-2 9-Position Sample Tray with Sample Spinner
The following link provides additional information from the instruction manual or original manufacturer's brochure. Right-click to open the PDF in a new window or download it:
http://www.labequip.com/stock/pictures/n1379.pdf

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